Wide Band Gap Semiconductor Materials and Devices
Contact: Michael S. Shur
CII 9017 CIEEM
110-8th Street, Rensselaer Polytechnic Institute
Troy, New York 12180-3590
(518) 276 2201 (518) 276 2990 (fax)
E-mail: shurm@rpi.edu Home page: http://www.ecse.rpi.edu/shur/
Subject Index
2-Dimensional Electron Gas, 20 AlGaN/GaN, 10, 11, 22, 23, 26, 27, 32, 35, 36, 48, 49, 60, 68, 69, 74, 75, 76, 77 AlGaN-GaN Heterostructures, 80 Breakdown Characteristics, 6, 86 Cyclotron Resonance, 44, 66 Deformation, 78 Detection of Microwave Radiation, 75 Doped Channel, 33, 34, 47, 48, 49, 65, 70, 76 Effective Mass, 44 Electron Mobility, 27, 61, 74, 75 Electronic Fluid, 75 Field Effect Transistors, 17, 22, 59 GaN Based Field Effect Transistors, 36, 38 GaN Diodes, 86 GaN/AlGaN, 12, 15, 17, 19, 28, 31, 33, 34, 47, 59, 65, 70, 81 GaN/AlN/GaN, 9 GaN-AlGaN, 20, 24, 37, 40, 44, 62, 66, 78, 87 GaN-AlN-GaN, 4, 5, 21, 79, 87 GaN-based field effect transistors, 18 GaN-InGaN Multiple Quantum Wells, 51 Gated Photodetector, 19 Hall Measurements, 31 Heterostructure Field Effect Transistor, 10, 15, 18, 19, 22, 23, 26, 28, 32, 33, 34, 47, 48, 49, 63, 65, 70, 76, 81, 90 Heterostructure Insulated Gate Field Effect Transistors, 11 High Power, 55, 70, 77, 81, 85 High Temperature Applications, 3, 8, 17, 50, 48, 68 impact ionization, 90 indium nitride, 83, 84 |
Indium Nitride, 73 Light Emitting Diodes, 43, 51, 58 Low frequency noise, 89 Microwave Operation, 33, 10, 65, 81 Monte Carlo Calculation, 2, 54, 82 Multiple Quantum Well, 58 High Field Electron Transport in GaN, 42, 88 Offset Gate, 69 Ohmic Contacts, 16, 31, 67 Optical phonon scattering, 13 Optoelectronic Devices, 12, 24, 35, 43, 60 Photodetectors, 59, 71 Piezoelectric effects, 7, 14, , 87 Piezoresistive Effect, 30, 79 Processing, 24, 46 Pyroelectric Effect, 45 Pyroelectricity, 52 Quantum Shift, 58 Semiconductor-Insulator-Semiconductor Structure, 4, 7, 5, 9, 21 SiC Devices, 16, 64 SiC Substrates, 68, 76, 80 SiC/AlN/SiC, 7 Silicon Carbide, 1, 3, 6, 8, 9, 16, 40 Silicon Carbide HJFET, 1 Stimulated Emission, 58 Strain, 4, 5, 9, 21, 25, 62 Substrate Bias, 76 Surface Reconstruction, 39 Ultraviolet Detectors, 53 Velocity overshoot, 83 Wide Band Gap Semiconductors, 12, 22, 29, 57 Zinc- Blende GaN, 39 |
Updated: 4/19/98